Proceedings of the IEEE 1987 Custom Integrated Circuits Conference

Proceedings of the IEEE 1987 Custom Integrated Circuits Conference

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... Digital Bipolar) Process Technology (3) NFT (Native Fault Testing) Refer to Honeywella#39;s Bipolar Design Manual for more infc are separate designs. ... PERFORMANCE-PROORAMMABIE MACROCELLS The individual gate arrays would not be a true family unless they were ... Feature, HM3S00 HM3500M HE8000 HM10000 HVM10000 HE12000 Equivalent Gates 3, 500 3, 500 8, 000 10, 000 10, 000anbsp;...


Title:Proceedings of the IEEE 1987 Custom Integrated Circuits Conference
Author: IEEE Electron Devices Society, Institute of Electrical and Electronics Engineers. Rochester Section, IEEE Solid-State Circuits Council
Publisher: - 1987
ISBN-13:

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